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Kaydon research, development, and testingScanning electron microscope (SEM)This state-of-the-art scanning electron microscope (SEM) provides high resolution, high magnification, and large depth of field for determining elemental properties, examining non-conductive material, and conducting failure analysis. The SEM provides up to 300,000x magnification and features a 5-axis motorized stage to position the sample for viewing; variable pressure mode for examining non-conductive material; and an X-ray function to determine elemental properties.
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